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Wednesday, July 29, 2020 | History

5 edition of Eighteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium found in the catalog.

Eighteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium

SEMI-THERM proceedings 2002 : San Jose, CA USA, March 12-14, 2002

by IEEE Semiconductor Thermal Measurement and Management Symposium (18th 2002 San Jose, Calif.)

  • 145 Want to read
  • 29 Currently reading

Published by IEEE in Piscataway, N.J .
Written in English

    Subjects:
  • Semiconductors -- Thermal properties -- Congresses,
  • Semiconductors -- Cooling -- Congresses

  • Edition Notes

    Other titlesSemiconductor Thermal Measurement and Management Symposium., SEMI-THERM proceedings 2002.
    Statement[sponsored by IEEE Components, Packaging, and Manufacturing Technology Society].
    GenreCongresses.
    ContributionsIEEE Components, Hybrids, and Manufacturing Technology Society.
    The Physical Object
    Paginationxii, [198] p. :
    Number of Pages198
    ID Numbers
    Open LibraryOL20525210M
    ISBN 100780373278, 0780373286
    OCLC/WorldCa49340161

    26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) ; VIEW 1 EXCERPT. The junction-to-case thermal resistance: A boundary condition dependent thermal metric Eighteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings () ;. Lifetime estimation of power electronics modules considering the target application. In 31st Annual Semiconductor Thermal Measurement and Management Symposium, SEMI-THERM - Proceedings. Institute of Electrical and Electronics Engineers Inc. p. (Annual IEEE Semiconductor Thermal Measurement and Management Symposium).Cited by: 2.

      Journal of Dynamic Systems, Measurement, and Control; High thermal conductivity was achieved at relative low volume fraction of the filler. The microstructure of the composites indicates that a continuous network is formed by the filler, which mainly completes the heat conduction. Proceedings of 18th Annual IEEE Semiconductor Thermal Cited by: Conference Paper (PDF Available) in Annual IEEE Semiconductor Thermal Measurement and Management Symposium - April with 71 Reads How we measure 'reads'.

    M. Jacquesnicki, J. H. Collet, A. Louri and A. Napieralski, “Hot spots and core-to-core thermal coupling in future multi-core architectures,” in Proceedings of the 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), . Phelan, P, Chiriac, V & Tom Lee, TY , Current and future miniature refrigeration cooling technologies for high power microelectronics. in Annual IEEE Semiconductor Thermal Measurement and Management Symposium. pp. , 17th Annual IEEE Semiconductor Thermal Measurement Symposium, San Jose, CA, United States, 3/20/Cited by: 8.


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Eighteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium by IEEE Semiconductor Thermal Measurement and Management Symposium (18th 2002 San Jose, Calif.) Download PDF EPUB FB2

Semiconductor Thermal Measurement and Management Symposium (Semi-Therm), IEEE [Institute of Electrical and Electronics Engineers, IEEE] on *FREE* shipping on qualifying offers. These papers are the forum for presenting new developments in and applications relating to generation and removal of heat within semiconductor devices and the measurement of junction.

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Thirteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium: Proceedings Austin, Tx, Usa, January[IEEE, IEEE Components Packaging & Manufacturin, Institute of Electrical and Electronics] on *FREE* shipping on Author: IEEE Components Packaging & Manufacturin.

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Semiconductor Thermal Measurement and Management Symposium, IEEE Twenty First Annual IEEE David Copeland Cooling of bit servers is constrained by increasing power and decreasing space.

Eighteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings () Location: San Jose, CA, USA Seventeenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat.

Get this from a library. Sixteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium: March, DoubleTree Hotel, San Jose, CA, USA. [Components, Packaging & Manufacturing Technology Society.;] -- "International forum for the presentation of new developments in and applications relating to generation and removal of heat within semiconductor.

Published in: Eighteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings () Proceedings () Article #:Cited by: (SEMI-THERM ) San Jose, California, USA March IEEE Catalog Number: ISBN: CFP14SEM-POD IEEE/CPMT 30th Semiconductor Thermal.

c 18th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems c 29th Annual SEMI Advanced Semiconductor Manufacturing Conference c 34th Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) 34th Thermal Measurement. Title IEEE/CPMT 30th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM ) Desc:Proceedings of a meeting held MarchSan Jose, California, USA.

Prod#:CFP14SEM-USB ISBN Pages:0 Format:USB Notes: Authorized distributor of all IEEE proceedings Publ:Institute of Electrical and Electronics Engineers (IEEE) POD Publ:Curran. (SEMI-THERM ) San Jose, California, USA 20 – 24 March IEEE Catalog Number: ISBN: CFP11SEM-PRT 27th Annual IEEE Semiconductor Thermal.

Title 27th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM ) Desc:Proceedings of a meeting held MarchSan Jose, California, USA. Prod#:CFP11SEM-POD ISBN Pages (1 Vol) Format:Softcover Notes: Authorized distributor of all IEEE proceedings TOC:View Table of Contents Publ:Institute of Electrical and.

Published in: Eighteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings () Proceedings () Article #:Cited by: 7. SEMI-TH initially scheduled on March 16 through Ma has been canceled. As the issue with the coronavirus continued to grow, many of our attendees, speakers, and exhibitors found themselves unable to attend due to company and government restrictions on travel.

Semiconductor Thermal Measurement and Management Symposium, IEEE Twenty-Second Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Annual IEEE Semiconductor Thermal Measurement and Management Symposium.

Country: United States - SIR Ranking of United States: H Index. Subject Area and Category: Engineering Electrical and Electronic Engineering Physics and Astronomy Instrumentation: Publisher: Publication type: Conferences and Proceedings: ISSN: The thermal management of a seven-die multichip module Conference Paper in Annual IEEE Semiconductor Thermal Measurement and Management Symposium February with 4 Reads How we measure 'reads'.

Get this from a library. 18th IEEE Semiconductor Thermal Measurement and Management Symposium. [IEEE Components, Manufacturing and Technology Society Staff,]. Welcome to SEMI-THERM 29 Conference Paper in Annual IEEE Semiconductor Thermal Measurement and Management Symposium March with 29 Reads How we measure 'reads'.

@article{SchweitzerTransientDI, title={Transient dual interface measurement — A new JEDEC standard for the measurement of the junction-to-case thermal resistance}, author={Dirk Schweitzer and Heinz Pape and Liu Chen and Rudolf Kutscherauer and Martin Walder}, journal={ 27th Annual IEEE Semiconductor Thermal Measurement and Management.

Improving thermoelectric energy harvesting efficiency by using graphene AIP Advances 6, ( S. Lee, in Semiconductor Thermal Measurement and Management Symposium, SEMI-THERM XI., Eleventh Annual IEEE () pp.

48 Cited by: 4.SEMI-THERM’s 27th annual symposium and exhibition will be held on Marchat the Doubletree Hotel in San Jose, California. For the and shows we have a limited number of 50 exhibit booths available each year.

Prime booth space will .